Patents/Assignees

JEOL Ltd.

112 patents in portfolio

US12261013utility2025
Charged Particle Beam System and Control Method Therefor
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US12261014utility2025
Scanning Electron Microscope and Objective Lens
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US12253445utility2025
Specimen Pretreatment Method
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US12255041utility2025
Electron Microscope and Method of Correcting Aberration
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US12255043utility2025
Scanning Electron Microscope and Image Generation Method Using Scanning Electron Microscope
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US12222658utility2025
Stage Apparatus and Electron Beam Lithography System
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US12206333utility2025
High Voltage Amplifier Circuit and Analyzer Apparatus
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US12148594utility2024
Charged Particle Beam Apparatus and Image Acquiring Method
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US12131881utility2024
Electron Microscope and Specimen Contamination Prevention Method
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US12112917utility2024
Sample Holder and Charged Particle Beam System
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US12103080utility2024
Particle Filtration from Air Recycling in a Three-dimensional Powder Bed Fusion Additive Manufacturing Apparatus
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US12105229utility2024
Radiation Detection Apparatus and Sample Analysis Apparatus
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US12020894utility2024
Beam Adjustment Method and Three-dimensional Powder Bed Fusion Additive Manufacturing Apparatus
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US12014914utility2024
Mass Spectrum Processing Apparatus and Method
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US11990312utility2024
Specimen Machining Device and Specimen Machining Method
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US11965903utility2024
Automated Analyzer and Method of Controlling Automated Analyzer
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US11959844utility2024
Automatic Analyzer, Cool Box, and Pouch
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US11959930utility2024
Automatic Analysis Apparatus
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US11961726utility2024
Mass Spectrum Processing Apparatus and Method
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US11953410utility2024
Specimen Support Tool, Support Apparatus and Specimen Preparation Method
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