Patents/Assignees

JEOL Ltd.

112 patents in portfolio

US12429333utility2025
Specimen Machining Device and Specimen Machining Method
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US12431319utility2025
Charged Particle Beam Device and Image Generation Method
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US12431323utility2025
Apparatus and Method for Milling Sample
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US12431326utility2025
Charged Particle Beam Device and Image Acquisition Method
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US12431328utility2025
Electron Microscope and Calibration Method
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US12422508utility2025
Sliding Band Capacitor Inductive Coupling in a Low Temperature Nuclear Magnetic Resonance Probe and Methods of Use
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US12412728utility2025
Electron Beam Inspection System
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US12399142utility2025
Scatter Diagram Display Device, Scatter Diagram Display Method, and Analyzer
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US12394591utility2025
Charged Particle Beam Apparatus
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US12362133utility2025
Transport Device and Charged Particle Beam System
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US12362134utility2025
Charged Particle Beam Apparatus and Image Adjustment Method
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US12354827utility2025
Aberration Correcting Device and Electron Microscope
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US12340997utility2025
Mass Spectrometry Method and Information Processing Device
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US12334300utility2025
Focused Ion Beam System and Method of Correcting Deviation of Field of View of Ion Beam
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US12332328utility2025
Angle Adjuster for NMR
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US12306197utility2025
Automatic Analyzer and Control Method for Automatic Analyzer
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US12291546utility2025
Phosphonium Compound, Reagent Kit for Derivatization, Mass Spectrometric Method, and Method for Producing Phosphonium Compound
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US12278084utility2025
Electron Microscope and Image Generation Method
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US12265093utility2025
Automatic Analyzer and Non-transitory Computer-readable Recording Medium Storing Program
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US12266502utility2025
Sample Milling Apparatus and Method of Adjustment Therefor
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