- US11927510utility2024Standard Calibration Solution0 cites
- US11927653utility2024Solid Sample Magnetic Coupling High Resolution Nuclear Magnetic Resolution Probe and Method of Use0 cites
- US11929238utility2024Ion Beam Processing Apparatus and Method for Controlling Operation Thereof0 cites
- US11885825utility2024Automated Analyzer and Method of Controlling the Automated Analyzer0 cites
- US11842880utility2023Estimation Model Generation Method and Electron Microscope0 cites
- US11837433utility2023Method of Measuring Relative Rotational Angle and Scanning Transmission Electron Microscope0 cites
- US11837437utility2023Specimen Machining Device and Information Provision Method0 cites
- US11828765utility2023Automatic Analysis Apparatus and Method of Controlling Automatic Analysis Apparatus0 cites
- US11801558utility2023Three-dimensional Powder Bed Fusion Additive Manufacturing Apparatus0 cites
- US11796518utility2023Apparatus and Method for Processing Mass Spectrum0 cites
- US11788976utility2023X-ray Measurement Apparatus and X-ray Measurement Method0 cites
- US11776787utility2023Charged Particle Beam Apparatus0 cites
- US11774525utility2023NMR Probe0 cites
- US11776786utility2023Focus Adjustment Method for Charged Particle Beam Device and Charged Particle Beam Device0 cites
- US11768214utility2023Automatic Analyzer and Automatic Analysis Method0 cites
- US11764029utility2023Method of Measuring Aberration and Electron Microscope0 cites
- US11754388utility2023Height Measuring Device, Charged Particle Beam Apparatus, and Height Measuring Method0 cites
- US11742176utility2023Transmission Electron Microscope and Method of Adjusting Optical System0 cites