Pin-wen Chen

8 Patents

• US124827052025

  Conductive Feature Formation and Structure Using Bottom-up Filling Deposition

  TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.

  0 cites
• US124553152025

  Chip with Power-glitch Detection and Power-glitch Self-testing

  MEDIATEK Inc.

  0 cites
• US122887162025

  Phase Control in Contact Formation

  Taiwan Semiconductor Manufacturing Company, Ltd.

  0 cites
• US122726002025

  Contact Features of Semiconductor Device and Method of Forming Same

  Taiwan Semiconductor Manufacturing Co., Ltd.

  0 cites
• US122527832025

  Chemical Vapor Deposition for Uniform Tungsten Growth

  Taiwan Semiconductor Manufacturing Company, Ltd.

  0 cites
• US120027122024

  Phase Control in Contact Formation

  TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.

  0 cites
• US119164322024

  Chip with Power-glitch Detection

  MEDIATEK Inc.

  0 cites
• US117774822023

  Gain-boosted Comparator

  MEDIATEK Inc.

  0 cites