19 Patents
- US125740382026Analog-to-digital Converter Circuit, an Electronic Device Including the Same and a Method for Controlling the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US125627472026Analog-to-digital Converter and Offset Correction Method Thereof
Sogang University Research Foundation
0 cites - 0 cites
- US125316132026Antenna Device for Beamforming and Wireless Communication Method Using the Same
UIF (UNIVERSITY INDUSTRYFOUNDATION), YONSEIUNIVERSITY
0 cites - US124247182025Attenuator Including Nonuniform Resistors and Apparatus Including the Same
INDUSTRY-ACADEMIC COOPERATION FOUNDATION, YONSEI UNIVERSITY
0 cites - US124073382025Frequency Multiplier Circuits Having Cross-coupled Capacitors Therein Which Support Frequency Multiplication
Industry-academic Cooperation Foundation, Yonsei University
0 cites - US123457622025Built-in Self-test Circuit and Temperature Measurement Circuit Including the Same
Samsung Electronics Co., Ltd.
0 cites - US121585012024Monitoring Circuit, Integrated Circuit Including the Same, and Operating Method of Monitoring Circuit
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US120812272024Digital-to-analog Converter and Apparatus Including the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US120578442024Digital Droop Detector, Semiconductor Device Including the Same, and Calibration Method Thereof
Samsung Electronics Co., Ltd.
0 cites - US119968572024Analog-to-digital Conversion Circuit and Receiver Including Same
Samsung Electronics Co., Ltd.
0 cites - 0 cites
- US118677572024Built-in Self-test Circuits and Semiconductor Integrated Circuits Including the Same
Samsung Electronics Co., Ltd.
0 cites - US118141952023Silicon Oxide Coated Aluminized Kapton Radiator Coating for Nano-satellite Thermal Management
United States Of America As Represented By The Administrator Of NASA
0 cites - US117574622023Analog-to-digital Conversion Circuit and Receiver Including Same
Samsung Electronics Co., Ltd.
0 cites - US116984102023Semiconductor Integrated Circuit and Method of Testing the Same
Samsung Electronics Co., Ltd.
0 cites - US116867662023Built-in Self-test Circuit and Temperature Measurement Circuit Including the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - 0 cites
- 0 cites