- US11621191utility2023Method for Fabricating a Semiconductor Device0 cites
- US11621214utility2023Semiconductor Package and Method for Manufacturing the Same0 cites
- US11621235utility2023Structures and Methods for Reducing Thermal Expansion Mismatch During Integrated Circuit Packaging0 cites
- US11621267utility2023Compact Electrical Connection That Can Be Used to Form an SRAM Cell and Method of Making the Same0 cites
- US11621268utility2023Semiconductor Device and Manufacturing Method Thereof0 cites
- US11621323utility2023Fill Fins for Semiconductor Devices0 cites
- US11621338utility2023Gate Stack Treatment for Ferroelectric Transistors0 cites
- US11621344utility2023Semiconductor Device0 cites
- US11621350utility2023Transistor Structure and Method with Strain Effect0 cites
- US11621351utility2023Epi Block Structure in Semiconductor Product Providing High Breakdown Voltage0 cites
- US11621352utility2023Semiconductor Device and Method of Manufacturing the Same0 cites
- US11621703utility2023Cell of Transmission Gate Free Circuit and Integrated Circuit Layout Including the Same0 cites
- US11621224utility2023Contact Features and Methods of Fabricating the Same in Semiconductor Devices0 cites
- US11616133utility2023Fin Field-effect Transistor Device and Method0 cites
- US11616142utility2023Semiconductor Device with Self-aligned Wavy Contact Profile and Method of Forming the Same0 cites
- US11614422utility2023Dual Gate Biologically Sensitive Field Effect Transistor0 cites
- US11614592utility2023Semiconductor Devices and Methods of Manufacture0 cites
- US11616125utility2023Integrated Circuit Device and Manufacturing Method Thereof0 cites
- US11615946utility2023Baffle Plate for Controlling Wafer Uniformity and Methods for Making the Same0 cites