- US12021122utility2024Semiconductor Device and Manufacturing Method Thereof0 cites
- US12021124utility2024Semiconductor Structures and Methods of Manufacturing the Same0 cites
- US12009396utility2024Semiconductor Device with Multichannel Heterostructure and Manufacturing Method Thereof0 cites
- US11984496utility2024Semiconductor Device with Multichannel Heterostructure and Manufacturing Method Thereof0 cites
- US11972996utility2024Semiconductor Device Structures and Methods of Manufacturing the Same0 cites
- US11961902utility2024Semiconductor Device with Multichannel Heterostructure and Manufacturing Method Thereof0 cites
- US11942525utility2024Semiconductor Device with Multichannel Heterostructure and Manufacturing Method Thereof0 cites
- US11942560utility2024Semiconductor Device Structures and Methods of Manufacturing the Same0 cites
- US11881478utility2024High Electron Mobility Transistor Device and Method for Manufacturing the Same0 cites
- US11863136utility2024Electronic Circuits and Semiconductor Device Having the Same0 cites
- US11854887utility2023Nitride-based Semiconductor Devices with Recesses for Dicing and Methods of Fabricating the Same0 cites
- US11837633utility2023Semiconductor Device and Manufacturing Method Therefor0 cites
- US11817451utility2023Semiconductor Device and Manufacturing Method Thereof0 cites
- US11784237utility2023Semiconductor Devices and Methods of Manufacturing the Same0 cites
- US11776934utility2023Semiconductor Apparatus and Fabrication Method Thereof0 cites
- US11769826utility2023Semiconductor Device with Asymmetric Gate Structure0 cites
- US11764210utility2023Electrostatic Protection Circuit and Electronic Device0 cites
- US11747389utility2023Device and Method for Measuring High Electron Mobility Transistor0 cites
- US11742397utility2023Semiconductor Device and Manufacturing Method Thereof0 cites
- US11733287utility2023Device and Method for Testing Semiconductor Devices0 cites