Contact Pin for Integrated Circuit Testing
USD1075695No. D 1,075,695designGranted 5/20/2025

Claims (1)
Claim 1 (Independent)
The ornamental design for a contact pin for integrated circuit testing as shown and described.
Full Description
Show full text →
is a Top Front Right Side Perspective view of a contact pin for integrated circuit testing showing my new design.
is a Bottom Rear Left Side Perspective view thereof.
is a Front view thereof.
is a Rear view thereof.
is a Left view thereof.
is a Right view thereof.
is a Top view thereof; and,
is a Bottom view thereof.
Figures (6)
Citations
This patent cites (31)
- US5639247
- US5823801
- US5841640
- US5899755
- US5947749
- US6854981
- US7059866
- USD524757
- US7445465
- US7632106
- US7639026
- US7771220
- US7819672
- US7914295
- USD719923
- USD727269
- USD749525
- USD749526
- US10114039
- USD1042344
- USD1042345
- USD1042346
- USD1042357
- US2014/0134899
- US2016/0161528
- US2016/0370406
- US1199735
- US70939
- US72532
- US52931-0001
- USD228536