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Patents/USD1075695

Contact Pin for Integrated Circuit Testing

USD1075695No. D 1,075,695designGranted 5/20/2025
Patent USD1075695 — Contact pin for integrated circuit testing — Figure 1
Fig. 1 · Contact Pin for Integrated Circuit Testing

Claims (1)

Claim 1 (Independent)

The ornamental design for a contact pin for integrated circuit testing as shown and described.

Full Description

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is a Top Front Right Side Perspective view of a contact pin for integrated circuit testing showing my new design.

is a Bottom Rear Left Side Perspective view thereof.

is a Front view thereof.

is a Rear view thereof.

is a Left view thereof.

is a Right view thereof.

is a Top view thereof; and,

is a Bottom view thereof.

Figures (6)

Fig. 1
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Fig. 6

Citations

This patent cites (31)

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