Contact Pin for Integrated Circuit Testing
USD1110279No. D 1,110,279designGranted 1/27/2026
Claims (1)
Claim 1 (Independent)
The ornamental design for a contact pin for integrated circuit testing as shown and described.
Full Description
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FIG. 1 is a top front right side perspective view of a contact pin for integrated circuit testing showing my new design. FIG. 2 is a bottom rear left side perspective view thereof. FIG. 3 is a front view thereof. FIG. 4 is a rear view thereof. FIG. 5 is a left view thereof. FIG. 6 is a right view thereof. FIG. 7 is a top view thereof; and, FIG. 8 is a bottom view thereof.
Citations
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