Zijie Hua

8 Patents

• US125469852026

  Dark-field Confocal Microscopy Measurement Apparatus and Method Based on Aperture Scanning of Vortex Illumination

  Harbin Institute Of Technology

  0 cites
• US123135632025

  Dark-field Confocal Microscopy Measurement Apparatus Based on Vortex Interference

  HARBIN INSTITUTE OF TECHNOLOGY

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• US122766152025

  Dark-field Confocal Microscopy Measurement Apparatus and Method Based on Multi-fractional Angular Momentum Demodulation

  Harbin Institute Of Technology

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• US122162642025

  Dark-field Confocal Microscopic Measurement Apparatus and Method Based on Vortex Dichroism

  Harbin Institute Of Technology

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• US122038672025

  Dark-field Confocal Microscopy Measurement Apparatus and Method Based on Differential Fractional Vortex Beam

  Harbin Institute Of Technology

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• US122040812025

  Dark-field Confocal Microscopy Measurement Apparatus and Method Based on Time-varying Fractional-order Vortex Demodulation

  Harbin Institute Of Technology

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• US121966862025

  Vortex Dichroism Dark-field Confocal Microscopy Measurement Apparatus Based on Spiral Transformation

  Harbin Institute Of Technology

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• US121114532024

  Differential Dark-field Confocal Microscopic Measurement Apparatus and Method Based on Polarized Vector Light Beam

  Harbin Institute Of Technology

  0 cites