5 Patents
- US123476842025Method and Structure for Cutting Dense Line Patterns Using Self-aligned Double Patterning
Yangtze Memory Technologies Co., Ltd.
0 cites - US120741052024Self-aligned Contacts in Three-dimensional Memory Devices and Methods for Forming the Same
YANGTZE MEMORY TECHNOLOGIES CO., Ltd.
0 cites - US117107302023Fabricating Method of Semiconductor Device with Exposed Input/output Pad in Recess
Yangtze Memory Technologies Co., Ltd.
0 cites - US116643092023Self-aligned Contacts in Three-dimensional Memory Devices and Methods for Forming the Same
YANGTZE MEMORY TECHNOLOGIES CO., Ltd.
0 cites - US115520122023Self-aligned Contacts in Three-dimensional Memory Devices and Methods for Forming the Same
YANGTZE MEMORY TECHNOLOGIES CO., Ltd.
0 cites