5 Patents
- US123984852025Method of Detecting Crystallographic Defects and Method of Growing an Ingot
SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY, CHINESE ACADEMY OF SCIENCES
0 cites - US124009172025Method for Verification of Conductivity Type of Silicon Wafer
SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY, CHINESE ACADEMY OF SCIENCES
0 cites - US123344032025Measuring Method of Resistivity of a Wafer
SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY CHINESE ACADEMY OF SCIENCES
0 cites - US120925882024Method for Characterizing Defects in Silicon Crystal
Shanghai Institute Of Microsystem And Information Technology, Chinese Academy Of Sciences
0 cites - US115603152023Graphene Structure Having Graphene Bubbles and Preparation Method for the Same
Shanghai Institute Of Microsystem And Information Technology, Chinese Academy Of Science, Shanghai, China
0 cites