Patents/Inventors

Zhongwei Chen

JiangxiCN27 patents

30 Patents

USD11128592026
Pool Light
0 cites
US124943422025
Systems and Methods for Charged Particle Flooding to Enhance Voltage Contrast Defect Signal
ASML Netherlands B.V.
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US124828312025
Nitrogen-doped Graphitized Carbon Material and Preparation Method
GRINM (Guangdong) Institute For Advanced Materials And Technology
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US124696682025
Systems and Methods for Compensating Dispersion of a Beam Separator in a Single-beam or Multi-beam Apparatus
ASML Netherlands B.V.
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US124244082025
Apparatus of Plural Charged-particle Beams
ASML Netherlands B.V.
0 cites
US123411502025
Quasi-solid-state Electrolyte Composite Based on Three-dimensionally Ordered Macroporous Metal-organic Framework Materials for Lithium Secondary Battery and Method for Manufacturing the Same
SOLID ULTRABATTERY Inc.
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US123411852025
Aqueous Zinc Lithium-ion Battery and Method for Making Same
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US123004582025
Objective Lens System for Fast Scanning Large FOV
ASML Netherlands B.V.
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US122491142025
Stripe Image Processing Method and Apparatus for Camera Optical Communication
Dachang Technology Development Co., Ltd
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US122371432025
Apparatus of Plural Charged-particle Beams
ASML Netherlands B.V.
0 cites
US121911092025
Sample Pre-charging Methods and Apparatuses for Charged Particle Beam Inspection
ASML Netherlands B.V.
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US120875412024
Apparatus of Plural Charged-particle Beams
ASML Netherlands B.V.
0 cites
US119357202024
Field-emission Type Electron Source and Charged Particle Beam Device Using the Same
0 cites
US119292322024
Systems and Methods for Charged Particle Flooding to Enhance Voltage Contrast Defect Signal
ASML Netherlands B.V.
0 cites
US118878072024
Apparatus of Plural Charged-particle Beams
ASML Netherlands B.V.
0 cites
US118547622023
MEMS Sample Holder, Packaged Product Thereof, and Apparatus of Charged-particle Beam Such as Electron Microscope Using the Same
BORRIES PTE. Ltd.
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US118547632023
Backscattered Electron Detector, Apparatus of Charged-particle Beam Such as Electron Microscope Comprising the Same, and Method Thereof
BORRIES PTE. Ltd.
0 cites
US118481692023
Field-emission Type Electron Source and Charged Particle Beam Device Using the Same
0 cites
US118374312023
Objective Lens System for Fast Scanning Large FOV
ASML Netherlands B.V.
0 cites
US117987772023
Charged Particle Beam Apparatus, and Systems and Methods for Operating the Apparatus
ASML Netherlands B.V.
0 cites
US117840242023
Multi-cell Detector for Charged Particles
ASML Netherlands B.V.
0 cites
US117156192023
Method and Apparatus for Charged Particle Detection
ASML Netherlands B.V.
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US117053042023
Apparatus of Plural Charged-particle Beams
ASML Netherlands B.V.
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US116885802023
Apparatus of Plural Charged-particle Beams
ASML Netherlands B.V.
0 cites
US116767922023
Sample Pre-charging Methods and Apparatuses for Charged Particle Beam Inspection
ASML Netherlands, B.V
0 cites
US116641862023
Apparatus of Electron Beam Comprising Pinnacle Limiting Plate and Method of Reducing Electron-electron Interaction
BORRIES PTE. Ltd.
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US116641892023
Apparatus of Charged-particle Beam Such as Scanning Electron Microscope Comprising Plasma Generator, and Method Thereof
BORRIES PTE. Ltd.
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US115939382023
Rapid and Automatic Virus Imaging and Analysis System as Well as Methods Thereof
BORRIRS PTE. Ltd.
0 cites
US115877582023
Apparatus of Plural Charged-particle Beams
ASML Netherlands B.V.
0 cites
US115690592023
Apparatus of Charged-particle Beam Such as Electron Microscope Comprising Plasma Generator, and Method Thereof
BORRIES PTE. Ltd.
0 cites