10 Patents
- US124025392025STT-MRAM Heat Sink and Magnetic Shield Structure Design for More Robust Read/write Performance
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US123102452025Etching and Encapsulation Scheme for Magnetic Tunnel Junction Fabrication
Headway Technologies, Inc.
0 cites - US122075662025MTJ Device Performance by Adding Stress Modulation Layer to MTJ Device Structure
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US119634572024MTJ Device Performance by Controlling Device Shape
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US118959282024Integration Scheme for Three Terminal Spin-orbit-torque (SOT) Switching Devices
Headway Technologies, Inc.
0 cites - US117858642023MTJ Device Performance by Adding Stress Modulation Layer to Mtj Device Structure
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd
0 cites - US117232862023STT-MRAM Heat Sink and Magnetic Shield Structure Design for More Robust Read/write Performance
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US116318022023Etching and Encapsulation Scheme for Magnetic Tunnel Junction Fabrication
Headway Technologies, Inc.
0 cites - US115734942023Critical Dimension (CD) Uniformity of Photoresist Island Patterns Using Alternating Phase Shifting Mask
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US115456222023CMP Stop Layer and Sacrifice Layer for High Yield Small Size MRAM Devices
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites