Patents/Inventors

Zhenlei Shen

Milpitas, CAUS44 patents

33 Patents

US126031442026
Block Health Detector for Block Retirement in a Memory Sub-system
Micron Technology, Inc.
0 cites
US125544242026
Power-off Monitor for Relaxed Block Retirement in a Memory Sub-system
Micron Technology, Inc.
0 cites
US125413982026
Management of Unmapped Allocation Units of a Memory Sub-system
Micron Technology, Inc.
0 cites
US123731112025
Monitoring Memory Device Health According to Data Storage Metrics
Micron Technology, Inc.
0 cites
US122724182025
Performing Select Gate Integrity Checks to Identify and Invalidate Defective Blocks
Micron Technology, Inc.
0 cites
US122609162025
Partial Block Handling in a Non-volatile Memory Device
Micron Technology, Inc.
0 cites
US121834062024
Eliminating Write Disturb for System Metadata in a Memory Sub-system
Micron Technology, Inc.
0 cites
US121647792024
Deck Based Media Management Operations in Memory Devices
Micron Technology, Inc.
0 cites
US120508082024
Selecting a Write Operation Mode from Multiple Write Operation Modes
Micron Technology, Inc.
0 cites
US120455122024
Read Refresh via Signal Calibration for Non-volatile Memories
Micron Technology, Inc.
0 cites
US119774802024
Scaling Factors for Media Management Operations at a Memory Device
Micron Technology, Inc.
0 cites
US119010142024
Partial Block Handling in a Non-volatile Memory Device
Micron Technology, Inc.
0 cites
US118940902024
Selective Power-on Scrub of Memory Units
Micron Technology, Inc.
0 cites
US118704612024
Failure-tolerant Error Correction Layout for Memory Sub-systems
Micron Technology, Inc.
0 cites
US118546442023
Performing Select Gate Integrity Checks to Identify and Invalidate Defective Blocks
Micron Technology, Inc.
0 cites
US117909982023
Eliminating Write Disturb for System Metadata in a Memory Sub-system
Micron Technology, Inc.
0 cites
US117753882023
Defect Detection in Memory Based on Active Monitoring of Read Operations
Micron Technology, Inc.
0 cites
US117766112023
Managing Write Disturb for Units of a Memory Device Using Weighted Write Disturb Counts
Micron Technology, Inc.
0 cites
US117638962023
Preread and Read Threshold Voltage Optimization
Micron Technology, Inc.
0 cites
US117565972023
Power-on Read Demarcation Voltage Optimization
Micron Technology, Inc.
0 cites
US117566352023
Decision for Executing Full-memory Refresh During Memory Sub-system Power-on Stage
Micron Technology, Inc.
0 cites
US117410082023
Disassociating Memory Units with a Host System
Micron Technology, Inc.
0 cites
US117202732023
Codeword Error Leveling for 3DXP Memory Devices
Micron Technology, Inc.
0 cites
US116937362023
Modifying Conditions for Memory Device Error Corrections Operations
Micron Technology, Inc.
0 cites
US116940172023
Temperature-based on Board Placement of Memory Devices
Micron Technology, Inc.
0 cites
US116872482023
Life Time Extension of Memory Device Based on Rating of Individual Memory Units
Micron Technology, Inc.
0 cites
US116884672023
Defect Detection in Memories with Time-varying Bit Error Rate
Micron Technology, Inc.
0 cites
US116569382023
Preemptive Read Verification After Hardware Write Back
Micron Technology, Inc.
0 cites
US116357942023
Memory Sub-system Temperature Throttling Relaxation
Micron Technology, Inc.
0 cites
US116261822023
Selective Power-on Scrub of Memory Units
Micron Technology, Inc.
0 cites
US116158302023
Performing a Refresh Operation Based on a Characteristic of a Memory Sub-system
Micron Technology, Inc.
0 cites
US115992722023
Deck Based Media Management Operations in Memory Devices
Micron Technology, Inc.
0 cites
US115617262023
Read Refresh via Signal Calibration for Non-volatile Memories
MICRON TECHNOLOGY, Inc.
0 cites