Zheng-yang Li

2 Patents

• US125910322026

  Automatic Calibration Method and Automatic Calibration Equipment for Testing Probe Set Used in Semiconductor Process

  UNITED MICROELECTRONICS Corp.

  0 cites
• US119553092024

  Automatic Adjustment Method and Automatic Adjustment Device of Beam of Semiconductor Apparatus, and Training Method of Parameter Adjustment Model

  UNITED MICROELECTRONICS Corp.

  0 cites