7 Patents
- US124055702025Method and Device for Compensating Surface Error of Holographic Grating Substrate
CHANGCHUN INSTITUTE OF OPTICS, FINE MECHANICS AND PHYSICS, CHINESE ACADEMY OF SCIENCES
0 cites - US123925992025Hybrid Displacement Measuring Device
CHANGCHUN INSTITUTE OF OPTICS, FINE MECHANICS AND PHYSICS, CHINESE ACADEMY OF SCIENCES
0 cites - US123926022025Littrow Grating Interferometry Device and Use Thereof
CHANGCHUN INSTITUTE OF OPTICS, FINE MECHANICS AND PHYSICS, CHINESE ACADEMY OF SCIENCES
0 cites - US122417392025Bidirectional Littrow Two-degree-of-freedom Grating Interference Measurement Device Based on Double Gratings
Changchun Institute Of Optics, Fine Mechanics And Physics, Chinese Academy Of Sciences
0 cites - US121887932025Heterodyne Two-dimensional Grating Measuring Device and Measuring Method Thereof
CHANGCHUN INSTITUTE OF OPTICS, FINE MECHANICS AND PHYSICS, ACADEMY OF SCIENCES
0 cites - US121887942025Grating Displacement Measurement Device and Method Using Double-layer Floating Reading Head, Medium, and Apparatus
Changchun Institute Of Optics, Fine Mechanics And Physics, Chinese Academy Of Sciences
0 cites - US118600572024Heterodyne One-dimensional Grating Measuring Device and Measuring Method Thereof
CHANGCHUN INSTITUTE OF OPTICS, FINE MECHANICS AND PHYSICS, CHINESE ACADEMY OF SCIENCES
0 cites