Patents/Inventors

Yuta Urano

TokyoJP7 patents

7 Patents

US124008892025
Defect Inspection Device
HITACHI HIGH-TECH CORPORATION
0 cites
US123665382025
Defect Inspection Apparatus and Defect Inspection Method
HITACHI HIGH-TECH CORPORATION
0 cites
US123456542025
Defect Inspection Device, Defect Inspection Method, and Adjustment Substrate
HITACHI HIGH-TECH CORPORATION
0 cites
US123135662025
Defect Inspection Device and Defect Inspection Method
Hitachi High-tech Corporation
0 cites
US120255692024
Defect Inspection Device and Inspection Method, and Optical Module
HITACHI HIGH-TECH CORPORATION
0 cites
US119826312024
Defect Detection Device, Defect Detection Method, and Defect Observation Apparatus Including Defect Detection Device
HITACHI HIGH-TECH CORPORATION
0 cites
US116445452023
Distance Measuring Device, Distance Measuring Method, and Three-dimensional Shape Measuring Apparatus
HITACHI, Ltd.
0 cites