3 Patents
- US123076502025Scanning Electron Microscope Device, Semiconductor Manufacturing Device, and Method of Controlling Semiconductor Manufacturing Device
Samsung Electronics Co., Ltd.
0 cites - US120573362024Estimating Heights of Defects in a Wafer by Scaling a 3D Model Using an Artificial Neural Network
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US120319262024Mesh-based Crystal Sample Holder for Serial Crystallography
POSTECH RESEARCH AND BUSINESS DEVELOPMENT FOUNDATION
0 cites