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Inventors
Yung-shiuan Chen
Hefei
CN
1 patent
2 Patents
US11852657
2023
Tester and Method for Calibrating Probe Card and Device Under Testing (DUT)
Changxin Memory Technologies, Inc.
0 cites
US11609705
2023
Memory Detection Method and Detection Apparatus
CHANGXIN MEMORY TECHNOLOGIES, Inc.
0 cites