Patents/Inventors

Yun Chang

Hwaseong-siKR2 patents

3 Patents

US121303062024
Module Substrate for Semiconductor Module, Semiconductor Module and Test Socket for Testing the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US120384732024
Test Socket for Performing a Test on an Electronic Device
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US120194852024
Storage Device Testing Module
SAMSUNG ELECTRONICS CO., Ltd.
0 cites