Patents/Inventors

Yukihiro Kagawa

KanonjiJP1 patent

2 Patents

US122923862025
Foreign Substance/defect Inspection Device, Image Generation Device in Foreign Substance/defect Inspection, and Foreign Substance/defect Inspection Method
VIENEX CORPORATION
0 cites
US122099712025
Foreign Substance/defect Inspection Device, Image Generation Device in Foreign Substance/defect Inspection, and Foreign Substance/defect Inspection Method
VIENEX CORPORATION
0 cites