6 Patents
- US125909032026Inspection Device and Inspection Method with Infrared Light for Scratch Detection on Inspection Target
MITSUBISHI HEAVY INDUSTRIES, Ltd.
0 cites - 0 cites
- US121070242024Semiconductor Device and Method of Manufacturing Semiconductor Device
Mitsubishi Electric Corporation
0 cites - 0 cites
- US119013262024Semiconductor Device with Branch Electrode Terminal and Method of Manufacturing Semiconductor Device
Mitsubishi Electric Corporation
0 cites - US118044142023Semiconductor Device Comprising a Lead Electrode Including a Through Hole
Mitsubishi Electric Corporation
0 cites