Yujiro Ikeda

2 Patents

• US124871982025

  Concentration Detection Device and Concentration Detection Method

  RIKEN

  0 cites
• US118413352023

  Nondestructive Inspection Method and Apparatus Comprising a Neutron Source and a Gamma-ray Detection Device for Determining a Depth of a Target Component in an Inspection Target

  RIKEN

  0 cites