Yuji Konyuba

5 Patents

• US124313282025

  Electron Microscope and Calibration Method

  JEOL Ltd.

  0 cites
• US122534452025

  Specimen Pretreatment Method

  JEOL Ltd.

  0 cites
• US119534102024

  Specimen Support Tool, Support Apparatus and Specimen Preparation Method

  JEOL Ltd.

  0 cites
• US116794892023

  Sample Chip Worktable and Retainer

  JEOL Ltd.

  0 cites
• US116580002023

  Sample Support and Method of Fabricating Same

  JEOL Ltd.

  0 cites