Patents/Inventors

Yugyung Lee

Suwon-siKR2 patents

2 Patents

US125731952026
Method for Evaluating Performance of Image Signal Processor
Samsung Electronics Co., Ltd.
0 cites
US122365672025
Image Evaluation Method That Can Quantify Images Distorted by Artifacts, Computer Program Performing the Method, and Computing Device
SAMSUNG ELECTRONICS CO., Ltd.
0 cites