Patents/Inventors

Yuchen Deng

EindhovenNL6 patents

7 Patents

US123470832025
Area Selection in Charged Particle Microscope Imaging
FEI Company
0 cites
US123273422025
Automatic Particle Beam Focusing
FEI Company
0 cites
US122160682025
Bifocal Electron Microscope
FEI Company
0 cites
US119064502024
Electron Diffraction Holography
FEI Company
0 cites
US118878092024
Auto-tuning Stage Settling Time with Feedback in Charged Particle Microscopy
FEI Company
0 cites
US117994862023
Systems and Methods for Quantum Computing Based Sample Analysis
FEI Company
0 cites
US117156182023
System and Method for Reducing the Charging Effect in a Transmission Electron Microscope System
FEI Company
0 cites