3 Patents
- US121747152024Deep Learning Method Integrating Prior Knowledge for Fault Diagnosis
Hefei University Of Technology
0 cites - US121242482024Method and Apparatus for Processing Accelerated Test Data Based on Multiple Performance Degradation, and Computer Device
CHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING RESEARCH INSTITUTE
0 cites - US116607452023Industrial Robot Motion Accuracy Compensation Method and System, and Computer Device
China Electronics Reliability And Environmental Testing Institute ((The Fifth Institute Of Electronics, Ministry Of Industry And Information Technology) (China Saibao Laboratory))
0 cites