Yuan-yao Chang

7 Patents

• US124179922025

  Chip Structure with Conductive Pillar and Method for Forming the Same

  TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.

  0 cites
• US121598092024

  System and Method for Measuring Device Inside Through-silicon via Surroundings

  TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.

  0 cites
• US120074312024

  Test Circuit and Method for Operating the Same

  TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.

  0 cites
• US119553922024

  System and Method for Measuring Device Inside Through-silicon via Surroundings

  Taiwan Semiconductor Manufacturing Company, Ltd.

  0 cites
• US119276282024

  Benchmark Circuit on a Semiconductor Wafer and Method for Operating the Same

  TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.

  0 cites
• US117546142023

  Semiconductor Device and Analyzing Method Thereof

  TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.

  0 cites
• US116887082023

  Chip Structure and Method for Forming the Same

  TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.

  0 cites