19 Patents
- 0 cites
- US123693322025Memory Device for Reducing Thermal Crosstalk
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US123546952025Trench Formation Scheme for Programmable Metallization Cell to Prevent Metal Redeposit
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US123102612025Memory Device Having via Landing Protection
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US123027672025Buffer Layer in Memory Cell to Prevent Metal Redeposition
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US122741822025Sidewall Spacer Structure for Memory Cell
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US120482582024Phase Change Memory Device and Method for Manufacturing the Same
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US119504342024Memory Device for Reducing Thermal Crosstalk
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US118716862024Resistive Random-access Memory (RRAM) Cell with Recessed Bottom Electrode Sidewalls
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US118551272023Semiconductor Structure and Method for Forming the Same
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
0 cites - US118189622023Sidewall Spacer Structure for Memory Cell
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - 0 cites
- US117857862023Trench Formation Scheme for Programmable Metallization Cell to Prevent Metal Redeposit
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US117858612023Semiconductor Structure and Method of Manufacturing the Same
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
0 cites - US1175140620233D RRAM Cell Structure for Reducing Forming and Set Voltages
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US117422622023Integrated Circuit Having a Resistor Layer Partially Overlapping Endcaps
TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.
0 cites - US116902322023High Density Memory Devices with Low Cell Leakage and Methods for Forming the Same
Taiwan Semiconductor Manufacturing Company Limited
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