47 Patents
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NANYA TECHNOLOGY CORPORATION
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NANYA TECHNOLOGY CORPORATION
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Taiwan Semiconductor Manufacturing Company, Ltd.
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Taiwan Semiconductor Manufacturing Co., Ltd.
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TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US125123242025Selective Formation of Titanium Silicide and Titanium Nitride by Hydrogen Gas Control
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites - 0 cites
- US124826572025Method of Manufacturing Semiconductor Structure Using Multi-layer Hard Mask
NANYA TECHNOLOGY CORPORATION
0 cites - US124530792025Method of Manufacturing Semiconductor Structure Comprising Edge Word Line and Central Word Line
NANYA TECHNOLOGY CORPORATION
0 cites - US124462552025Semiconductor Structure with Source/drain Multi-layer Structure and Method for Forming the Same
Parabellum Strategic Oppurtunities Fund LLC
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EHUNTSUN HEALTH TECHNOLOGY CO., Ltd.
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TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
0 cites - US123174822025Semiconductor Structure and Method of Manufacturing the Same Including Buried Word Lines of Different Widths
NANYA TECHNOLOGY CORPORATION
0 cites - US123007292025Low Resistant Contact Method and Structure
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US122708522025Method and System for Wafer-level Testing
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
0 cites - US122651192025Repackaging IC Chip for Fault Identification
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US122454212025Semiconductor Device with Bit Line Contacts of Different Pitches
NANYA TECHNOLOGY CORPORATION
0 cites - 0 cites
- US122197092025Forming Trench in IC Chip Through Multiple Trench Formation and Deposition Processes
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US121989912025Test Structure for Use in Dynamic Random Access Memory and Manufacturing Method Thereof
NANYA TECHNOLOGY CORPORATION
0 cites - 0 cites
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ALTEK SEMICONDUCTOR CORPORATION
0 cites - US120875752024Conductive Feature Formation and Structure
TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.
0 cites - US120664842024Method and Device for Wafer-level Testing
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
0 cites - US120256552024Method and System for Wafer-level Testing
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
0 cites - US119905502024Semiconductor Structure with Source/drain Multi-layer Structure and Method for Forming the Same
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US119729512024Selective Formation of Titanium Silicide and Titanium Nitride by Hydrogen Gas Control
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites - US119504082024Semiconductor Structure and Method of Manufacturing the Same
NANYA TECHNOLOGY CORPORATION
0 cites - US119422772024Method of Manufacturing Semiconductor Structure and Semiconductor Structure
NANYA TECHNOLOGY CORPORATION
0 cites - 0 cites
- US119031862024Method for Manufacturing Semiconductor Device with Bit Line Contacts of Different Pitches
NANYA TECHNOLOGY CORPORATION
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National Cheng Kung University
0 cites - US117546212023Method and Device for Wafer-level Testing
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
0 cites - US117058332023Motor Controller, Motor Control Method and Computer Program Product for Vehicle Assist Control
CHROMA ATE Inc.
0 cites - 0 cites
- US116301492023Method and System for Wafer-level Testing
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
0 cites - 0 cites
- US115692282023Semiconductor Structure and Method of Manufacturing the Same
NANYA TECHNOLOGY CORPORATION
0 cites