13 Patents
- US125754092026Interconnect Level with High Resistance Layer and Method of Forming the Same
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites - US123621572025Methods for Spindle Mechanism Monitoring and Maintenance in Processing a Semiconductor Substrate
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US123545962025Centralized Feedback Service for Performance of Virtual Assistant
Amazon Technologies, Inc.
0 cites - 0 cites
- US120149102024Method and System for Adjusting Location of a Wafer and a Top Plate in a Thin-film Deposition Process
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites - US119843652024Semiconductor Structure Inspection Using a High Atomic Number Material
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US119729352024Methods for Processing a Semiconductor Substrate
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites - US119292632024Method and System for Manufacturing Semiconductor
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
0 cites - 0 cites
- US117681472023Quantum Flow Cytometer
GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY OF COMMERCE
0 cites - US117412862023Method and System of Generating a Layout Diagram
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US115695762023Apparatus for Broadband Wavelength Conversion of Dual-polarization Phase-encoded Signal
NKB Properties Management, LLC
0 cites - US115615302023Method for Predicting and Compensating Frictions of Feed System, and Computer Readable Storage
DELTA ELECTRONICS, Inc.
0 cites