Patents/Inventors

Yu-ann Lai

Hsin-ChuTW1 patent

2 Patents

US121639952024
Gan Reliability Built-in Self Test (BIST) Apparatus and Method for Qualifying Dynamic On-state Resistance Degradation
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites
US116809782023
Gan Reliability Built-in Self Test (BIST) Apparatus and Method for Qualifying Dynamic On-state Resistance Degradation
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites