Patents/Inventors

Youping Zhang

Cupertino, CAUS10 patents

10 Patents

US125911782026
Method for Adjusting a Patterning Process
ASML NETHERLANDS B.V.
0 cites
US122422012025
Determining Hot Spot Ranking Based on Wafer Measurement
ASML NETHERLANDS B.V.
0 cites
US120559042024
Method to Predict Yield of a Device Manufacturing Process
ASML NETHERLANDS B.V.
0 cites
US120449802024
Method of Manufacturing Devices
ASML NETHERLANDS B.V.
0 cites
US120386942024
Determining Pattern Ranking Based on Measurement Feedback from Printed Substrate
ASML NETHERLANDS B.V.
0 cites
US119661662024
Measurement Apparatus and a Method for Determining a Substrate Grid
ASML NETHERLANDS B.V.
0 cites
US119472662024
Method for Controlling a Manufacturing Process and Associated Apparatuses
ASML NETHERLANDS B.V.
0 cites
US118031272023
Method for Determining Root Cause Affecting Yield in a Semiconductor Manufacturing Process
ASML NETHERLANDS B.V.
0 cites
US116356992023
Determining Pattern Ranking Based on Measurement Feedback from Printed Substrate
ASML NETHERLANDS B.V.
0 cites
US115681232023
Method for Determining an Etch Profile of a Layer of a Wafer for a Simulation System
ASML Netherlands B.V.
0 cites