Patents/Inventors

Younguk Chang

Suwon-siKR1 patent

2 Patents

US117552342023
Method of Generating Signal for Test in Memory Device Using Multi-level Signaling and Memory Device Performing the Same
Samsung Electronics Co., Ltd.
0 cites
US115698362023
Multi-level Signal Generator and Memory Device Including the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites