Patents/Inventors

Youngnam Yun

Yongin-siKR1 patent

2 Patents

US124186232025
Method of Inspecting Image Quality, Image Quality Inspection System Performing the Same, and Display Device to Which the Same Is Applied
SAMSUNG DISPLAY CO., Ltd.
0 cites
US121145532024
Display Device and Method for Processing Image Signal Thereof
SAMSUNG DISPLAY CO., Ltd.
0 cites