12 Patents
- US125909002026Wafer Inspection Apparatus Using Three-dimensional Image and Method of Inspecting Wafer Using the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US125936592026Spectroscopic Device, Spectroscopic Method Using the Same, and Method of Fabricating Semiconductor Memory Device Using the Same
Samsung Electronics Co., Ltd.
0 cites - US125784672026Light Detection and Ranging (lidar)-based Inspection Device and Method of Manufacturing Semiconductor Device
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US125661282026Measurement Apparatus and Measurement Method Using the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US124742602025Terahertz Signal Measuring Apparatus and Measuring Method
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US124361222025Apparatus and Method for Measuring a Layer of a Semiconductor Device Using X-ray Diffraction
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US123859462025Method of Inspecting Tip of Atomic Force Microscope and Method of Manufacturing Semiconductor Device
KOREA ADVANCED INSTITUTE OF SCIENCE AND Technology
0 cites - US123621382025Method of Operating Scanning Electron Microscope (SEM) and Method of Manufacturing Semiconductor Device Using the Same
Samsung Electronics Co., Ltd.
0 cites - US123321642025Dual Resolution Spectrometer, and Spectrometric Measurement Apparatus and Method Using the Spectrometer
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US123321862025Method and System for Inspecting Semiconductor Wafer and Method of Fabricating Semiconductor Device Using the Same
KOREA UNIVERSITY RESEARCH AND BUSINESS FOUNDATION
0 cites - US121109382024Vibration Isolation Table for Semiconductor Equipment and Vibration Isolation Table System Including the Same
Samsung Electronics Co., Ltd.
0 cites - 0 cites