Young Seop Choi

4 Patents

• US122345552025

  Substrate Treating Apparatus and Filler Member Provided Therein

  SEMES CO., Ltd.

  0 cites
• US122241892025

  Substrate Type Sensor and Method of Measuring the Impact Point and the Impact Force of Chemical

  SEMES CO., Ltd.

  0 cites
• US120610972024

  Substrate Type Sensor for Measuring Horizontality of Substrate Support Member Provided in Atmosphere Accompanied by Temperature Change, Method for Measuring Horizontality of Substrate Support Member by Using the Same, and Non-transitory Computer Readable Medium

  SEMES CO., Ltd.

  0 cites
• US119338082024

  Buffer Unit and Method for Storaging Substrate Type Sensor for Measuring of Horizontality of a Substrate Support Member Provided on a Temperature Varying Atmosphere

  SEMES CO., Ltd.

  0 cites