Youn Gon Oh

5 Patents

• US124513822025

  Tray and Destructive Analysis Automation Apparatus Including the Same

  SAMSUNG ELECTRONICS CO., Ltd.

  0 cites
• US123438812025

  Equipment Front End Module and Destructive Analysis Automation Apparatus Including the Same

  SAMSUNG ELECTRONICS CO., Ltd.

  0 cites
• US122835022025

  Substrate Transfer Device and Substrate Transfer Method

  SAMSUNG ELECTRONICS CO., Ltd.

  0 cites
• US119827052024

  Substrate Analysis Apparatus and Substrate Analysis Method

  SAMSUNG ELECTRONICS CO., Ltd.

  0 cites
• US119843382024

  Substrate Transfer System

  Samsung Electronics Co., Ltd.

  0 cites