Patents/Inventors

Youfei Jiang

Milpitas, CAUS9 patents

10 Patents

US125923572026
System and Method for Multi-beam Electron Microscopy Using a Detector Array
KLA Corporation
0 cites
US124513192025
Electron Source with Magnetic Suppressor Electrode
KLA Corporation
0 cites
US123745242025
In-lens Wafer Pe-charging and Inspection with Multiple Beams
ASML Netherlands B.V.
0 cites
US122834532025
Creating Multiple Electron Beams with a Photocathode Film
KLA Corporation
0 cites
US121911092025
Sample Pre-charging Methods and Apparatuses for Charged Particle Beam Inspection
ASML Netherlands B.V.
0 cites
US121658312024
Method and System of Image-forming Multi-electron Beams
KLA CORPORATION
0 cites
US121658372024
System and Method for Scanning a Sample Using Multi-beam Inspection Apparatus
ASML Netherlands B.V.
0 cites
US120681292024
Tilt-column Multi-beam Electron Microscopy System and Method
KLA Corporation
0 cites
US117494952023
Bandpass Charged Particle Energy Filtering Detector for Charged Particle Tools
KLA Corp.
0 cites
US116767922023
Sample Pre-charging Methods and Apparatuses for Charged Particle Beam Inspection
ASML Netherlands, B.V
0 cites