You-hsien Lin

3 Patents

• US119945532024

  Signal Transmission Circuit and Method, and Integrated Circuit (IC)

  Changxin Memory Technologies, Inc.

  0 cites
• US118526572023

  Tester and Method for Calibrating Probe Card and Device Under Testing (DUT)

  Changxin Memory Technologies, Inc.

  0 cites
• US116144812023

  Through-silicon via Detecting Circuit, Detecting Methods and Integrated Circuit Thereof

  Changxin Memory Technologies, Inc.

  0 cites