Yosuke Sekiguchi

3 Patents

• US125309122026

  Image Analysis Method, Apparatus, Program, and Learned Deep Learning Algorithm

  SYSMEX CORPORATION

  0 cites
• US120568692024

  Image Analysis Method, Image Analysis Apparatus, and Image Analysis Program for Analyzing Cell with Deep Learning Algorithm

  SYSMEX CORPORATION

  0 cites
• US118425562023

  Image Analysis Method, Apparatus, Program, and Learned Deep Learning Algorithm

  SYSMEX CORPORATION

  0 cites