Patents/Inventors

Yoshinori Fujiwara

Boise, IDUS16 patents

17 Patents

US125800362026
Apparatuses and Methods for Forcing Memory Cell Failures in a Memory Device
Micron Technology, Inc.
0 cites
US123944562025
Apparatuses and Methods Including Dice Latches in a Semiconductor Device
Micron Technology, Inc.
0 cites
US123945012025
Apparatus with Adjustable Diagnostic Mechanism and Methods for Operating the Same
Micron Technology, Inc.
0 cites
US123546942025
Apparatuses and Methods for Dynamic Column Select Swapping
Micron Echnology, Inc.
0 cites
US121004672024
Systems and Methods for Testing Redundant Fuse Latches in a Memory Device
Micron Technology, Inc.
0 cites
US121004762024
Test Mode Security Circuit
Micron Technology, Inc.
0 cites
US120790762024
Apparatuses, Systems, and Methods for Error Correction
0 cites
US120617952024
Repair Element Availability Communication
Micron Technologies, Inc.
0 cites
US119551602024
Asynchronous Signal to Command Timing Calibration for Testing Accuracy
Micron Technolgy, Inc.
0 cites
US119157752024
Apparatuses and Methods for Bad Row Mode
Micron Technology, Inc.
0 cites
US117910112023
Self-repair Verification
Micron Technology, Inc.
0 cites
US117839092023
Systems and Methods for Power Savings in Row Repaired Memory
Micron Technology, Inc.
0 cites
US117420442023
Memory Built-in Self-test with Adjustable Pause Time
Micron Technology, Inc.
0 cites
US117279672023
Apparatuses and Methods Including Dice Latches in a Semiconductor Device
Micron Technology, Inc.
0 cites
US117052142023
Apparatuses and Methods for Self-test Mode Abort Circuit
Micron Technologv. Inc.
0 cites
US116703562023
Apparatuses and Methods for Refresh Address Masking
Micron Technology, Inc.
0 cites
US116451342023
Apparatuses and Methods for Fuse Error Detection
Micron Technology, Inc.
0 cites