Yoshimasa Ono

7 Patents

• US125055742025

  Imaging Condition Determination Method, Imaging Condition Determination System, Imaging Condition Determination Device, and Computer Readable Medium

  NEC CORPORATION

  0 cites
• US124495422025

  Measurement Apparatus, Information Processing Apparatus, Data Specifying Method, and Non-transitory Computer-readable Medium

  NEC CORPORATION

  0 cites
• US123393672025

  Detection Device, Determination Method, and Non-transitory Computer-readable Medium

  NEC CORPORATION

  0 cites
• US122174822025

  Processing Apparatus, Processing Method, and Computer Readable Medium

  NEC CORPORATION

  0 cites
• US121755932024

  Display Device, Display Method, and Non-transitory Computer-readable Medium Having Program Stored Therein

  NEC CORPORATION

  0 cites
• US121542582024

  Surface Abnormality Detection Device and System

  NEC CORPORATION

  0 cites
• US118691792024

  Abnormal Part Display Apparatus, Abnormal Part Display System, Abnormal Part Display Method, and Abnormal Part Display Program

  NEC CORPORATION

  0 cites