11 Patents
- US126074612026Apparatus for Ultrasonically Measuring Thin Film Thickness with Retroreflector and Method Thereof
CENTER FOR ADVANCED META-MATERIALS
0 cites - US126096742026Full Transmission Device for Wide-angle Mode Conversion of Elastic Waves
CENTER FOR ADVANCED META-MATERIALS
0 cites - US125781872026Apparatus for Ultrasonically Measuring Thin Film Thickness with Retroreflector and Method Thereof
CENTER FOR ADVANCED META-MATERIALS
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- US123665582025Ultrasonic Transmission Device and Wave Control Method
CENTER FOR ADVANCED META-MATERIALS
0 cites - US123322152025Mode Conversion Reflector
THE INDUSTRY & ACADEMIC COOPERATION IN CHUNGNAM NATIONAL UNIVERSITY (IAC)
0 cites - US122663332025Matching Media for Perfect Transmission of Ultrasonic Waves
CENTER FOR ADVANCED META-MATERIALS
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- US117675602023Diagnostic and Treatment Method for Endometrial Cavity Distorting Uterine Leiomyoma Using Microrna
KOREA UNIVERSITY RESEARCH AND BUSINESS FOUNDATION
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