Patents/Inventors

Yoojin Jeong

Suwon-siKR1 patent

2 Patents

US124875322025
EUV Collector Inspection Apparatus and Inspection Method
Samsung Electronics Co., Ltd.
0 cites
US116762632023
Extreme Ultraviolet (EUV) Collector Inspection Apparatus and Method
SAMSUNG ELECTRONICS CO., Ltd.
0 cites