Yongho Cho

3 Patents

• US118412762023

  Error Correction Unit and Object Temperature Detection Device

  EMTAKE Inc.

  0 cites
• US117552342023

  Method of Generating Signal for Test in Memory Device Using Multi-level Signaling and Memory Device Performing the Same

  Samsung Electronics Co., Ltd.

  0 cites
• US115698362023

  Multi-level Signal Generator and Memory Device Including the Same

  SAMSUNG ELECTRONICS CO., Ltd.

  0 cites