Patents/Inventors

Yohei Minekawa

TokyoJP15 patents

6 Patents

US126026192026
Machine Learning System and Machine Learning Method
Hitachi High-tech Corporation
0 cites
US125117292025
Defect Classification Device and Defect Classification Program
Hitachi High-tech Corporation
0 cites
US123336952025
Sample Observation System and Image Processing Method
HITACHI HIGH-TECH CORPORATION
0 cites
US122605452025
Sample Observation Device and Method
Hitachi High-tech Corporation
0 cites
US121542642024
Defect Inspecting System and Defect Inspecting Method
HITACHI HIGH-TECH CORPORATION
0 cites
US116705282023
Wafer Observation Apparatus and Wafer Observation Method
HITACHI HIGH-TECH CORPORATION
0 cites