Yoav Grauer

8 Patents

• US126191622026

  Extra Tall Target Metrology

  KLA Corporation

  0 cites
• US125298782026

  High Contrast Imaging in Bonded Sample Metrology Using Oblique Illumination

  KLA Corporation

  0 cites
• US123931132025

  Inter-step Feedforward Process Control in the Manufacture of Semiconductor Devices

  KLA CORPORATION

  0 cites
• US123723452025

  3D Profilometry with a Linnik Interferometer

  KLA Corporation

  0 cites
• US121469602024

  Gated Imaging Apparatus, System and Method

  BRIGHTWAY VISION Ltd.

  0 cites
• US121115802024

  Optical Metrology Utilizing Short-wave Infrared Wavelengths

  KLA Corporation

  0 cites
• US117264102023

  Multi-resolution Overlay Metrology Targets

  KLA Corporation

  0 cites
• US116769092023

  Metrology Targets for High Topography Semiconductor Stacks

  KLA Corporation

  0 cites