Patents/Inventors

Yixiang Wang

Fremont, CAUS22 patents

22 Patents

US125675582026
Systems and Methods for Pulsed Voltage Contrast Detection and Capture of Charging Dynamics
ASML Netherlands B.V.
0 cites
US124943422025
Systems and Methods for Charged Particle Flooding to Enhance Voltage Contrast Defect Signal
ASML Netherlands B.V.
0 cites
US124513242025
Leveling Sensor in Multiple Charged-particle Beam Inspection
ASML Netherlands B.V.
0 cites
US123927322025
Multi-source Illumination Unit and Method of Operating the Same
ASML Netherlands B.V.
0 cites
US123680672025
Method, Apparatus, and System for Dynamically Controlling an Electrostatic Chuck During an Inspection of Wafer
ASML Netherlands B.V.
0 cites
US122179272025
Beam Manipulation of Advanced Charge Controller Module in a Charged Particle System
ASML Netherlands B.V.
0 cites
US121424512024
System for Inspecting and Grounding a Mask in a Charged Particle System
ASML Netherlands B.V.
0 cites
US121424562024
Self-differential Confocal Tilt Sensor for Measuring Level Variation in Charged Particle Beam System
ASML NETHERLANDS B.V.
0 cites
US121256692024
Thermal-aided Inspection by Advanced Charge Controller Module in a Charged Particle System
ASML Netherlands B.V.
0 cites
USD10445312024
Safety Laser Radar
Jininng Keli Photoelectronic Industrial Co., Ltd.
0 cites
US120875422024
Image Contrast Enhancement in Sample Inspection
ASML Netherlands B.V.
0 cites
US120721812024
Inspection Apparatus and Method
ASML NETHERLANDS B.V.
0 cites
US120515622024
Method, Apparatus, and System for Wafer Grounding
ASML Netherlands B.V.
0 cites
US120280002024
Object Table Comprising an Electrostatic Clamp
ASML Netherlands B.V.
0 cites
US119292322024
Systems and Methods for Charged Particle Flooding to Enhance Voltage Contrast Defect Signal
ASML Netherlands B.V.
0 cites
US118154732023
Methods of Inspecting Samples with Multiple Beams of Charged Particles
ASML Netherlands B.V.
0 cites
US118089302023
Optical Objective Lens
ASML Netherlands B.V.
0 cites
US117281312023
Thermal-aided Inspection by Advanced Charge Controller Module in a Charged Particle System
ASML Netherlands B.V.
0 cites
US116825382023
Optical System with Compensation Lens
ASML Netherlands B.V.
0 cites
US116375122023
Object Table Comprising an Electrostatic Clamp
ASML Netherlands B.V.
0 cites
US115811612023
Systems and Methods for Etching a Substrate
ASML Netherlands, B.V.
0 cites
US115628842023
Current Source Apparatus and Method
ASML Netherlands B.V.
0 cites